40-6554-10

This universal test socket allows often removed devices, such as PROMs and EPROMs, to be inserted and removed many times without the possibility of leg damage. When the integral lever is in the vertical position, the socket holes are open and the IC can be easily inserted. When the lever is moved to the horizontal position the socket clAmps the legs of the device firmly, ‘locking' it into place. The wide socket holes enable ICs with 0.3", 0.4" and 0.6" pitch pins to be used in the same sockets thus allowing the VAst majority of devices to be used.

• 40 Position Universal ZIF (Zero Insertion Force) test socket for DIP integrated circuits
• Standard 0.600" (15.24mm) row spacing compatible with a wide range of DIP devices
• Zero insertion force mechanism prevents lead damage during device insertion and removal
• Normally closed contacts provide dependable electrical connection without relying on the plastic housing to maintain contact pressure
• High-reliability beryllium copper contacts with matte tin plating over nickel underplate. The "-10" suffix specifies tin-over-nickel plated contacts
• Accepts DIP package leads from 0.015" to 0.045" wide and 0.110" to 0.280" long
• Rated for up to 25,000 to 50,000 insertion/removal cycles, ideal for production testing and development applications
• Contact current rating of 1A with dielectric withstand voltage of 1000VAC
• Black UL94V-0 glass-filled PPS body with stainless steel operating handle for durability
• Can be soldered directly to a PCB or plugged into compatible Aries test socket receptacles